WITec and Tescan have been recognized with a 2015 Photonics Prism Award. An expert jury named the correlative RISE microscope as winner in the metrology category. The Prism Award is given for top innovations in the field of photonics, granted by Photonics Media and sponsored by the international Society for Optics and Photonics (SPIE.). The winners were chosen from more than 130 applicants. RISE was developed within the FP7 project UnivSEM.
RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. This unique combination enables the most comprehensive sample characterization: electron microscopy is an excellent technique for visualizing sample surface structures in the nanometer range; confocal Raman imaging is an established spectroscopic method used for the detection of the chemical and molecular components of a sample. It can also generate 2D- and 3D-images and depth profiles to visualize the distribution of the molecular compounds within a sample. The RISE Microscope enables for the first time the acquisition of SEM and Raman images from the same sample area and the correlation of ultra-structural and chemical information with one microscope system.
“The RISE Microscope is another striking example of WITec’s enormous innovative strength. We are proud to once again receive a Prism Award, the second after being recognized in 2011 for WITec’s TrueSurface microscopy technology”, says Dr. Olaf Hollricher, WITec Managing Director R&D.
“The success of the RISE Microscope is clear evidence of the competence of our R&D team but also of our ability to grow working contacts with prominent research institutions as well as with leading innovative companies. The innovative strength of the TESCAN ORSAY HOLDING is an important driving force of our outstanding business success”, says Ing. Jaroslav Klíma, CEO at TESCAN ORSAY HOLDING, a.s.
The microscope’s development was a joint effort of WITec and TESCAN within the UNIVSem project, funded by the EU. It provides all functions and features of a stand-alone SEM and a confocal Raman microscope. Both SEM and Raman are high-resolution imaging techniques with sub-nanometer and diffraction-limited 200-300 nanometer resolution, respectively. In Raman imaging mode the sample can be scanned through a range of 250 µm x 250 µm x 250 µm. RISE Microscopy pairs ease-of-use with exceptional analyzing benefits and is therefore suited to a large variety of applications such as nanotechnology, materials sciences, geology and life sciences.
During this event, main achievements of this project in construction and testing of Universal SEM – multi-nano-analytical tool will be presented. UnivSEM tool is a cutting edge analytical system for visualization, analysis and modification objects within nano-volumes, co-developed by multiple partners within 7th Framework Programme. The unique combination of various analytical techniques sets up the trend for correlative microscopy and provides researchers with a powerful tool to investigate advanced materials and nano-scopic objects (often in-situ). In industrial environment the additional quality control of various nanotechnologies is enabled. Some of these applications from field of fields of plasmonics, photovoltaics, material and semiconductor research will be presented.
Because this project raised a lot of attention for its technical achievements, it is also often highlighted as the success case of cooperation between research-intensive small and medium enterprises in Europe. By visiting this workshop you will have the opportunity to discuss the individual motivations and expected outputs, such as increased competitiveness and growth of involved companies. The synergy between FP7 and structural funds will be also demonstrated on this EU project.
MAIN PRESENTATION TOPICS:
- Scanning electron microscope system with ultra-high resolution and 3D tomography – integration based innovation
- Correlative SEM and confocal Raman Imaging for new markets
- Development of a new Time-of-flight Secondary ion mass spectrometer (SIMS) and impact on a small company.
- Scanning probe microscope integrated with SEM and new opportunities in material research
- Applications in fields of plasmonics, photovoltaics, material and semiconductor research
CZELO – Czech Liaison Office for Research, Development and Innovation
Rue du Trône 98 (6th floor)
EVENT PROGRAM (12th MARCH 2015)
15:00 Welcome note
15:10 Projects results, applications & exploitation (ongoing and foreseen)
16:30 Apero & networking activities
17:30 End of the event
No conference fees will be charged for this event, but registration is obligatory. Seats are limited.
Please, register to this workshop till Thursday 5th of March 2015 at http://geform.tc.cz/univsem_diss/
We are looking forward to meeting you in at this final UnivSEM dissemination event.
On April 29-30th 2014 UnivSEM project organized a dissemination workshop in the new premises of the Tescan Orsay Holding in Brno, Czech Republic. The presentations on:
- Correlative SEM and Confocal Raman Imaging (WITec) ,
- Scanning probe microscope integrated with SEM/FIB (SPECS) ,
- Performance and Application Examples of Secondary ion Mass Spectrometry on a FIB-SEM Microscope Platform (EMPA) ,
- Correlative analysis of complex material systems from the fields of life science and photovoltaics (MPI) ,
- Fabrication and Characterisation techniques and UnivSEM (CITEC-BUT) are now online.
Speakers from universities and industry will present their scientific achievements and talk about several aspects of modern Raman imaging. The poster session will provide an opportunity to learn more about recent scientific results in Raman imaging from various fields of applications, while the equipment demonstration will give a detailed introduction to the operational principles and instrumental configurations relevant to confocal Raman microscopy. At symposium, you may also see the new RISE Microscope demonstration (Correlated Raman-SEM Imaging) – output of UnivSEM project.
Raman Conference location
City of Ulm: Stadthaus and Minster
During the three-day conference the participants will have sufficient time for in-depth discussions and close interaction with leading scientists and users of WITec microscope systems.
Scientists interested in chemically identifying and imaging the compounds of a sample at the highest spatial resolution are invited to participate.
The number of participants is limited, so please register early to ensure your participation.
Please visit http://www.witec.de/events/11th-raman-symposium/ for detailed program and registration information
On April 29-30th 2014 UnivSEM project organized a dissemination workshop in the new premises of the Tescan Orsay Holding in Brno, Czech Republic. The participants were welcomed by the Chair of the Board of the holding, Mr. Jaroslav Klíma, who stressed the importance of the correlative microscopy for the future progress in the material research and in process development. The UnivSEM coordinator, Dr. Jaroslav Jiruše (TESCAN Brno, s.r.o) presented The New Multifunctional FIB-SEM Tool for Nanotechnology. His talk was followed by presentations of Olaf Hollricher (WITec GmbH), Oliver Schaff (SPECS Surface Nano Analysis GmbH), James Whitby (EMPA), Fredrik Oestlund (TOFWERK AG), Dietmar Vogel, Fraunhofer ENAS), Björn Hoffman (Max Planck Institute for the Science of Light), Tomáš Šikola (Brno University of Technology), Alexander Korsunsky (University of Oxford), Patrick Philipp (CEA, Unit. d’Instrumentation Scientifique) and Helena Desciova (ON SEMICONDUCTOR Czech Republic, s.r.o.) The workshop participants had the opportunity to see several practical demonstrations and had possibility to discuss with the dedicated experts on all integrated technologies from UnivSEM project.
The presentations from the workshop will be available on UnivSEM webpage soon.
The agenda of the workshop could be found here.
A microscope, unique even by world standards. This is one of the outcomes of the scientific reseach at CEITEC BUT, which also serves as an example of how to access European funds. Scientists from CEITEC BUT are giving the example. Thanks to well-chosen instruments and technology acquired through the targeted support of the ERDF – European Regional Development Fund, for large infrastructures and approved by the Czech government, they have been able to obtain and implement research projects awarded directly by the European Commission. The result of the synergy of national and european grant policy is exemplified by the participation of CEITEC BUT scientists in the scientific research project UnivSEM. This is financed from the main instruments of the European Union for financing research and development, 7th Framework Programme (7th FP).
The whole press release could be found here.
Specialists from Germany, the Czech Republic, and Switzerland are jointly advancing novel, correlative microscope techniques to provide new opportunities for the detailed analysis of nanostructures. Their work is part of the EU-funded project UnivSEM, which supports the development of supplementary analysis tools for scanning electron microscopes (SEM). UnivSEM receives funding from the European Union Seventh Framework Program (FP7/2007-2013) under grant agreement n° 280566. As part of the UnivSEM project, TESCAN ORSAY HOLDING, a multinational company experienced in charged particle optics and WITec, a distinguished German specialist in Raman and scanning probe microscopy, successfully introduced a correlative microscopy technique which combines electron microscopy with Raman microscopy. The resulting RISE (Raman Imaging and Scanning Electron) Microscopy technique enables for the first time ultra-structural and chemical imaging with one microscope.
The whole press release in the occasion of the product launch of RISE (Raman Imaging and Scanning Electron) Microscopy could be found here. The product was launched at Analytica – Trade fair for instrumental analysis, laboratory technology and biotechnology. About 18 press representatives joined the conference. The press was also interested in the presentation of EC project officer Dr. René Martins. Additionally to the press conference we distributed around 50 press kits at Analytica.
Feel free to download the full text here:
The full citation of the article:
Deborah Alberts, Leandro von Werra, Fredrik Oestlund, Urs Rohner, Markus Hohl, Johann Michler, James A. Whitby, Instrumentation Science and Technology DOI: 10.1080/10739149.2013.878843