UnivSEM dissemination workshop

IMG_7451On April 29-30th 2014 UnivSEM project organized a dissemination workshop in the new premises of the Tescan Orsay Holding in Brno, Czech Republic. The participants were welcomed by the Chair of the Board of the holding, Mr. Jaroslav Klíma, who stressed the importance of the correlative microscopy for the future progress in the material research and in process development. The UnivSEM coordinator, Dr. Jaroslav Jiruše (TESCAN Brno, s.r.o) presented The New Multifunctional FIB-SEM Tool for Nanotechnology. His talk was followed by presentations of Olaf Hollricher (WITec GmbH), Oliver Schaff (SPECS Surface Nano Analysis GmbH), James Whitby (EMPA), Fredrik Oestlund (TOFWERK AG), Dietmar Vogel, Fraunhofer ENAS), Björn Hoffman (Max Planck Institute for the Science of Light), Tomáš Šikola (Brno University of Technology), Alexander Korsunsky (University of Oxford), Patrick Philipp (CEA, Unit. d’Instrumentation Scientifique) and Helena Desciova (ON SEMICONDUCTOR Czech Republic, s.r.o.) The workshop participants had the opportunity to see several practical demonstrations and had possibility to discuss with the dedicated experts on all integrated technologies from UnivSEM project.

The presentations from the workshop will be available on UnivSEM webpage soon.

The agenda of the workshop could be found here.